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A policy insight into the R&D-patent relationship
Gaétan de Rassenfosse & Bruno van Pottelsberghe de la Potterie
Research Policy, Volume 38, Issue 5, 2009, Pages 779-792
Abstract
Contrary to an accepted wisdom, this paper shows that cross-country variations in the number of patents per researcher do not only reflect differences in the propensity to patent but also signals differences in research productivity. We put forward and test an empirical model that formally accounts for the productivity and the propensity component of the R&D-patent relationship. The two components play an important role, as witnessed by the impact of several policies, including education, intellectual property and science and technology policies. Indicators based on domestic priority filings reflect research efforts and are primarily affected by varying propensities to patent. In contrast, international filings, especially triadic patents, rather capture variations in research productivity.
Keywords:
Patstat; Priority filing; Propensity to patent; Research productivity; S&T policy
JEL classification codes:
O30; O38
Links:
Published version; Working Paper version; Cannot download? Contact me!
Author's notes
This article:
- Shows that patent indicators can be used to assess research productivity (i.e. research performance) -- especially triadic patent counts;
- Shows that the R&D-patent relationship is affected both by the propensity to patent and by the productivity of research;
- Shows that Innovation policies, Education policies and Science & Technology policies affect the R&D-patent ratio (support for the national innovation system-type of approach to policy making);
- Introduces a corrected count of priority filings that includes national priority filings, priority patent applications at the European Patent Office (EPO) and priority patent applications at the United States Patent and Trademark Office (USPTO);
- Estimates that the price elasticity of demand for patents is about -0.3;
- Is one of the first to use the Patstat database (EPO Worldwide Patent Satistical Database).
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